Bücher Wenner
Volker Kutscher liest aus "RATH"
18.11.2024 um 19:30 Uhr
Characterization, Testing, Measurement, and Metrology
von Chander Prakash, Sunpreet Singh, J. Paulo Davim
Verlag: Taylor & Francis
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ISBN: 978-1-000-19335-0
Auflage: 1. Auflage
Erschienen am 25.10.2020
Sprache: Englisch
Umfang: 204 Seiten

Preis: 80,49 €

Klappentext
Biografische Anmerkung
Inhaltsverzeichnis

As the field of materials and manufacturing has progressed tremendously, there is a need for up-to-date knowledge with respect to the latest novelties, techniques and applications.



Chander Prakash, Sunpreet Singh, J. Paulo Davim



1. Mechanical Property Characterization of Construction Materials. 2. Evaluation of Material Surface Integrity. 3. Characterizations: SEM/FESEM, EDS, XRD, XPS, AFM, TEM, STEM, FTIR, DSC, TGA, DMA. 4. Mechanical Behaviour: Fracture, Damage, Fatigue. 5. Tribology and Wear. 6. Interfaces and Interphases. 7. Creep and Aggressive Environment. 8. Corrosion. 9. Measurement, Performance Analysis, and Characterization of Materials, Devices, and Systems
using Advanced Technologies. 10. Characterization of Surfaces and the Relationship between Surface Properties and their
Applications. 11. Surface Metrology - Measurement and Characterization of Surface Topography including
Functional Properties of Surfaces. 12. Measurement & Metrology in Materials and Advanced Manufacturing: Roughness, Forces, Corrosion, Wear, Crack Propagation and Fatigue. 13. Monitoring and Control of Machining/Manufacturing Processing of Advanced Materials. 14. Optimization of Machining/Manufacturing Processing. 15. Computational Intelligence: Neural, fuzzy, Genetic, and Swarm Particle Optimization. 16. Vision-Based Control and Control Engineering.


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