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25.11.2024 um 19:30 Uhr
Solid-State Imaging with Charge-Coupled Devices
von A. J. Theuwissen
Verlag: Springer Netherlands
Reihe: Solid-State Science and Technology Library Nr. 1
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ISBN: 978-0-306-47119-3
Auflage: 1995
Erschienen am 15.12.2005
Sprache: Englisch
Umfang: 390 Seiten

Preis: 309,23 €

Inhaltsverzeichnis
Klappentext

Symbol List. List of Figures. Preface. 0. Introduction. 1. Fundamentals of charge-coupled devices. 2. Into, through and out of a charge-coupled device. 3. A real CCD delay line. 4. Solid-state imaging at a glance. 5. Fundamentals of solid-state imaging. 6. Solid-state imaging for television applications. 7. Advanced imaging: light sensitivity. 8. Advanced imaging: noise and smear. 9. Advanced imaging: device architectures. 10. Nonconsumer imaging. Appendix 1: How CCD imagers are made. Appendix 2: How to interpret CCD artifacts. Appendix 3: How to compromise on CCD specifications. References. Index.



Solid-State Imaging with Charge-Coupled Devices covers the complete imaging chain: from the CCD's fundamentals to the applications. The book is divided into four main parts: the first deals with the basics of the charge-coupled devices in general. The second explains the imaging concepts in close relation to the classical television application. Part three goes into detail on new developments in the solid-state imaging world (light sensitivity, noise, device architectures), and part four rounds off the discussion with a variety of applications and the imager technology.
The book is a reference work intended for all who deal with one or more aspects of solid- state imaging: the educational, scientific and industrial world. Graduates, undergraduates, engineers and technicians interested in the physics of solid-state imagers will find the answers to their imaging questions. Since each chapter concludes with a short section `Worth Memorizing', reading this short summary allows readers to continue their reading without missing the main message from the previous section.


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