Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects. Key materials and devices are reviewed including silicon photonics, vertical-cavity surface-emitting lasers (VCSELs), InGaN LEDs and lasers, and AlGaN LEDs, covering the majority of optoelectronic devices that we use in our everyday lives, powering the Internet, telecommunication, solid-state lighting, illuminators, and many other applications. This book features contributions from experts in industry and academia working in these areas and includes numerous practical examples and case studies.This book is suitable for new entrants to the field of optoelectronics working in R&D.

• Includes case studies and numerous examples showing best practices and common mistakes affecting optoelectronics reliability written by experts working in the industry
• Features the first wide-ranging and comprehensive overview of fiber optics reliability engineering, covering all elements of the practice from building a reliability laboratory, qualifying new products, to improving reliability on mature products
• Provides a look at the reliability issues and failure mechanisms for silicon photonics, VCSELs, InGaN LEDs and lasers, AIGaN LEDs, and more

1. Introduction to optoelectronic devicesRobert W. Herrick and Qiang Guo2. Reliability engineering in optoelectronic devices and fiber optic transceiversRobert W. Herrick3. Case studies in fiber optic reliabilityRobert W. Herrick4. Materials science of defects in GaAs-based semiconductor lasersKunal Mukherjee5. Grown-in defects and thermal instability affecting the reliability of lasers: III-Vs versus III nitridesOsamu Ueda and Shigetaka Tomiya6. Reliability of lasers on silicon substrates for silicon photonicsJustin C. Norman, Daehwan Jung, Alan Y. Liu, Jennifer Selvidge, Kunal Mukherjee, John E. Bowers and Robert W. Herrick7. Degradation mechanisms of InGaN visible LEDs and AlGaN UV LEDsC. De Santi, A. Caria, F. Piva, G. Meneghesso, E. Zanoni and M. Meneghini